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Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate.
Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate.
We, Welcome you to the 2013 MRS Fall Exhibit being held between December 3-5, at the Hynes Convention Center in Boston.
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sales@anarghyainnotech.comMob: +91 9845019130
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